By Gernot Friedbacher, Henning Bubert
Surveying and evaluating all concepts appropriate for functional functions in floor and skinny movie research, this moment variation of a bestseller is an important advisor to this scorching subject in nano- and floor expertise. This new e-book has been revised and up-to-date and is split into 4 components - electron, ion, and photon detection, in addition to scanning probe microscopy. New chapters were further to hide such suggestions as SNOM, FIM, atom probe (AP),and sum frequency new release (SFG). Appendices with a precis and comparability of thoughts and an inventory of apparatus providers make this e-book a quick reference for fabrics scientists, analytical chemists, and people operating within the biotechnological industry.From a overview of the 1st version (edited by way of Bubert and Jenett)"... an invaluable resource..."(Journal of the yankee Chemical Society)
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Extra info for Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications
The depth resolution achievable during proﬁling depends on many variables, and the reader is referred to the comprehensive discussion in Refs [18, 19]. In XPS, chemical information as a function of depth is acquired comparatively slowly in a stepwise fashion, by using alternate cycles of sputtering and analysis. 9, in which the respective contributions from the metallic and oxide components of the iron and chromium spectra have been quantiﬁed [20a]. 9 Depth proﬁles of thin (3–5 nm) oxide ﬁlms [20a] on: (a) Pure iron; (b) Fe–12Cr– 1Mo alloy.
The two are equivalent, the different usages having arisen for historical reasons, but the differentiation is a convenient one. 1 Spectroscopic and X-ray notations. Quantum numbers n 1 2 2 2 3 3 3 3 3 l 0 0 1 1 0 1 1 2 2 etc. j 1/2 1/2 1/2 3/2 1/2 1/2 3/2 3/2 5/2 Spectroscopic state X-ray state 1s 2s 2p1/2 2p3/2 3s 3p1/2 3p3/2 3d3/2 3d5/2 etc. K L1 L2 L3 M1 M2 M3 M4 M5 etc. scheme describing the orbital motion of an electron around an atomic nucleus, in which the total angular momentum of an electron is found by summing vectorially the individual electron spin and angular momenta.
4. , ideal for XPS). As can be seen from the universal curve, plenty of usable intensity exists down into the ultraviolet (UV) region. With suitable monochromators on the output to select a particular wavelength, the photon energy can be tuned continuously from about 20 to 500 eV. The available intensities are comparable to those from conventional line sources. The main advantage here is the small beam diameter of the synchrotron radiation, which allows a high spatial resolution. Furthermore, polarized radiation for probing electron spin properties in magnetic materials is available.
Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications by Gernot Friedbacher, Henning Bubert